Product data
Non-contact surface metrology system
brief introduction:

The cyberSCAN VANTAGE 2 is a non-contact surface metrology system. It combines high resolution confocal sensor technology with a x- and y-translation stage. The system can measure large areas up to 200 mm with maximum x-, y-, z-resolution. All electronic components are integrated into a robust housing, no cables or external controllers are required. The system is connected with a single USB cab

Product details
Technology
  • Fast and accurate magnetic linear motors
  • Measurement speed: 2 kHz / 4 kHz
  • 200 mm travel in x- and y-direction, lateral resolution 0.05 µm
  • 2D profiles and 3D topographical maps (topography measurement)
  • Large scanning areas, up to the maximum travel of 200 mm with maximum x-, y-, z-resolution
  • Chromatic white light sensors
  • High resolution camera
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